Reconstruction of Shape and Position for Scattering Objects by Linear Sampling Method
A.R. Eskandari1, M. Naser-Moghaddasi2, M. Eskandari3

1A.R. Eskandari, Department of Engineering, East Tehran Branch, Islamic Azad University, Tehran, Iran.
2M. Naser-Moghaddasi, Faculty of Eng., Science and Research Branch, Islamic Azad University, Tehran, Iran.

3M. Eskandari, Electrical and Computer Engineering Department, Isfahan University of Technology, Isfahan, Iran.
Manuscript received on February 02, 2012. | Revised Manuscript received on February 10, 2012. | Manuscript published on March 05, 2012. | PP: 5-9 | Volume-2 Issue-1, March 2012. | Retrieval Number: A0367012111/2012©BEIESP
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Abstract: This paper presents an approach for shape and position reconstruction of a scattering object using microwaves where the scatterer is assumed to be a homogenous dielectric medium. The employed technique assumes no prior knowledge of the scatter’s material properties like electric permittivity and conductivity, and the far-field pattern is used as the only primary information in identification. The approach proposed consists of retrieving the shape and the position of the scattering object using a linear sampling method. The technique results in high computational speed and efficiency. In addition, the technique can be generalized for any scatterer structure. Numerical results are used to validate the feasibility of the proposed approach.
Keywords: Shape Reconstruction, Inverse Scattering, Microwave Imaging, Linear Sampling Method (LSM).