A Special Method for Analysing and Correction of Set Effects in PIC Microcontroller
Sijoy Johnson1, N. Kumaresan2, Manu Poulose3
1Sijoy Johnson, Embedded System Technology, Anna University of Technology Coimbatore, India.
2N Kumaresan, Electronics and Communication Engineering Anna University of Technology Coimbatore.
3Manu Poulose , Control and Instrumentation , Anna University of Technology, Coimbatore, India.
Manuscript received on July 01, 2012. | Revised Manuscript received on July 04, 2012. | Manuscript published on July 05, 2012. | PP: 339-342 | Volume-2, Issue-3, July 2012. | Retrieval Number: C0759062312 /2012©BEIESP
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© The Authors. Published By: Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: In this paper the fault tolerance behaviour of a PIC micro-controller has been checked. This experiment is based on injection of different transient faults in various points.. The experimental results have been compared in different aspects. Program counter is found to be as the most infected components after simulated results. The failure rate of this program counter is more than 50%. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of flip-flop. Thus, studying the behaviour of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behaviour of SET Effects in PIC microcontroller with massive critical paths in the presence of an SET. We also propose novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a Single Event Upset (SEU) caused by particle strike on the internal nodes of a flip-flop.
Keywords: ADC, Single Event Transients (SET),Single event upsets (SEU) ,UART.