Reliability Data Analysis Procedures for Comparing Failure Rates of the System Using Optimal Truncation of Short Tests
Sangeetha.M1, Arumugam.C2, Sapna P.G3, Senthil Kumar .K.M4

1M.Sangeetha, CSE, Coimbatore Institute of Technology, Coimbatore, India.
2C.Arumugam, Mech, Coimbatore Institute of Technology, Coimbatore, India.

3Sapna P.G, Mech, Coimbatore Institute of Technology, Coimbatore, India.
Manuscript received on February 09, 2012. | Revised Manuscript received on February 13, 2012. | Manuscript published on March 05, 2012. | PP: 111-116 | Volume-2 Issue-1, March 2012. | Retrieval Number: A0394012112/2012©BEIESP
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Abstract: A test was described for two systems, long term and short term with an exponentially distributed time between failures. The test is intended for checking the ratio MTBFl /MTBFs exceeds or equals a prescribed value, versus one that it is less than the prescribed value, by means of long term tests with large average sample number in the earlier system. Our proposed system focus on improving test by using low average sample number in short term which is having the advantage of economy in time requirement and cost. It produces optimum truncated test called binomial Sequential Probability Ratio Test. Criteria are proposed for determining the characteristics of truncated test followed with the discretizing effect of truncation on error probabilities with a view to optimization of its parameters. The search algorithm for truncation apex used in this system achieves closeness to the optimum which depends on successful choice of the initial approximation, search boundaries and on the search step. The enhanced reliability of modern technological systems, combined with the reduced time quotas allotted for creating new system is capable of yielding a highly efficacious test which increases reliability and feasibility of decisions.
Keywords:  MTBF, Short Truncate Test, Long Term, ADP