Density of Defect
Uthaya Vasanthan S1, Karthikeyan B2
1Uthaya Vasanthan.S, Student M.S III Year, SITE School, VIT University, Vellore, Tamil Nadu, India.
2Karthikeyan.B, Student M.S III Year, SITE School, VIT University, Vellore, Tamil Nadu, India.
Manuscript received on June 05, 2013. | Revised Manuscript received on June 29, 2013. | Manuscript published on July 05, 2013. | PP: 13-15 | Volume-3 Issue-3, July 2013. | Retrieval Number: B1442053213/2013©BEIESP
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© The Authors. Published By: Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: The main objective of this project is to come out with a new and effective idea for measuring the quality of the software (software quality metrics). The existing product quality metrics which is a subset of the software quality metrics focus on measuring the quality by MTTF [Mean Time To Failure] and DD [DEFECT DENSITY]. We bring in a new idea called the “DENSITY OF DEFECT”, stressing that quality of the product can be better judged by measuring the DENSITY of the identified defect, proving that merely the number of defects will not be an effective parameter in quality estimation as stated in DEFECT DENSITY. This project’s scope will also include how the density of defect idea can be effective enough in measuring not only the quality but also in reducing the effort of identifying and correcting the individual defect.
Keywords: DD–Defect Density. D(D) — Density of Defect. LOC — Lines Of Code.